A reliability appraisal of semiconductor devices

The current problems of assessing the reliability of semiconductor devices are discussed, and reference is made to the order of reliability required in typical applications. The evidence from life tests carried out on devices drawn from production lines of transistors and diodes shows how variations in operating conditions and assessment levels affect the apparent reliability of the devices. This type of appraisal gives a useful guide to the reliability of semiconductor devices in typical service use. The incidence of inoperative failures, the trends shown by measurements of major characteristics during life, and the form of life-survival curves are discussed, and a brief reference is made to the equipment used in carrying out the tests.