• DocumentCode
    1398475
  • Title

    Guilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations

  • Author

    Monden, Akito ; Okahara, Satoshi ; Manabe, Yuki ; Matsumoto, Ken-ichi

  • Author_Institution
    Nara Inst. of Sci. & Technol., Nara, Japan
  • Volume
    28
  • Issue
    2
  • fYear
    2011
  • Firstpage
    42
  • Lastpage
    47
  • Abstract
    To increase productivity, programmers often unwittingly violate open source software licenses by reusing code fragments, or clones. The authors explore metrics that can reveal the existence or absence of code reuse and apply these metrics to 1,225 open source product pairs.
  • Keywords
    industrial property; public domain software; software metrics; software reusability; clone metrics; code fragment reuse; open source licensing violation; software license; open source software reuse; product metrics; software licensing violations;
  • fLanguage
    English
  • Journal_Title
    Software, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7459
  • Type

    jour

  • DOI
    10.1109/MS.2010.159
  • Filename
    5661763
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1398475