• DocumentCode
    1398626
  • Title

    A Physics-Based Analysis of Image Appearance Models

  • Author

    Xu, Yilei ; Chowdhury, Amit K Roy

  • Author_Institution
    Navteq Corp., Chicago, IL, USA
  • Volume
    33
  • Issue
    8
  • fYear
    2011
  • Firstpage
    1681
  • Lastpage
    1688
  • Abstract
    Linear and multilinear models (PCA, 3DMM, AAM/ASM, and multilinear tensors) of object shape/appearance have been very popular in computer vision. In this paper, we analyze the applicability of these heuristic models from the fundamental physical laws of object motion and image formation. We prove that under suitable conditions, the image appearance space can be closely approximated to be multilinear, with the illumination and texture subspaces being trilinearly combined with the direct sum of the motion and deformation subspaces. This result provides a physics-based understanding of many of the successes and limitations of the linear and multilinear approaches existing in the computer vision literature, and also identifies some of the conditions under which they are valid. It provides an analytical representation of the image space in terms of different physical factors that affect the image formation process. Numerical analysis of the accuracy of the physics-based models is performed, and tracking results on real data are presented.
  • Keywords
    approximation theory; computer vision; image motion analysis; image texture; computer vision; computer vision literature; deformation subspaces; heuristic models; image appearance models; image appearance space; image formation; image formation process; image space; motion subspace; multilinear models; numerical analysis; object motion; physical laws; physics-based analysis; physics-based model; texture subspace; Analytical models; Computational modeling; Face; Lighting; Shape; Solid modeling; Three dimensional displays; Image appearance models; deformation; face tracking.; multilinear; theoretical analysis;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2010.216
  • Filename
    5661785