• DocumentCode
    1398771
  • Title

    A Multi-Granularity Power Modeling Methodology for Embedded Processors

  • Author

    Park, Young-Hwan ; Pasricha, Sudeep ; Kurdahi, Fadi J. ; Dutt, Nikil

  • Author_Institution
    Samsung Adv. Inst. of Technol., Yongin, South Korea
  • Volume
    19
  • Issue
    4
  • fYear
    2011
  • fDate
    4/1/2011 12:00:00 AM
  • Firstpage
    668
  • Lastpage
    681
  • Abstract
    With power becoming a major constraint for multiprocessor embedded systems, it is becoming important for designers to characterize and model processor power dissipation. It is critical for these processor power models to be useable across various modeling abstractions in an electronic system level (ESL) design flow, to guide early design decisions. In this paper, we propose a unified processor power modeling methodology for the creation of power models at multiple granularity levels that can be quickly mapped to an ESL design flow. Our experimental results based on applying the proposed methodology on the OpenRISC and MIPS processors demonstrate the usefulness of having multiple power models. The generated models range from very high-level two-state and architectural/instruction set simulator models that can be used in transaction level models, to extremely detailed cycle-accurate models that enable early exploration of power optimization techniques. These models offer a designer tremendous flexibility to trade off estimation accuracy with estimation/simulation effort.
  • Keywords
    embedded systems; microprocessor chips; MIPS processor; OpenRISC processor; electronic system level design flow; multigranularity power modeling methodology; multiprocessor embedded system; power dissipation; power optimization technique; Digital systems; embedded processor performance; embedded processor power estimation; multi-granularity levels;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2009.2039153
  • Filename
    5401086