• DocumentCode
    1399082
  • Title

    Leading-Subcycles Capacitor Error-Averaging Scheme for Cyclic ADCs

  • Author

    Kuo, Chun-Hsien ; Fan, Tso-Hung ; Kuo, Tai-Haur

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    60
  • Issue
    3
  • fYear
    2011
  • fDate
    3/1/2011 12:00:00 AM
  • Firstpage
    776
  • Lastpage
    783
  • Abstract
    This paper proposes a leading-subcycles capacitor error-averaging (LCEA) scheme to reduce the capacitor mismatch error of cyclic analog-to-digital converters (ADCs) while only slightly lowering the conversion rate. The scheme does not need complicated structures or extra calibration circuits. Hence, the proposed LCEA scheme can be used for cyclic ADCs to achieve high accuracy while maintaining their low-power and small-area features. In addition, the figure of merit (FOM) versus the number of averaging operations in a complete conversion cycle is analyzed such that power-accuracy-speed tradeoffs can be optimized. A proof of concept 12-bit cyclic ADC is implemented to compare the performance of the proposed LCEA scheme with that of a conventional cyclic ADC. The chip is fabricated in a 3.3-V, 0.35-μm CMOS process. Measurements demonstrate that the cyclic ADC with only two averaging operations has a 6 dB and 10 dB higher signal-to-noise-and-distortion ratio (SNDR) and spurious-free dynamic range (SFDR), respectively, than the conventional cyclic ADC, and with only a slightly reduced conversion rate of 12/13 times than that of the conventional cyclic ADC. In addition, the measured FOM is greatly reduced to 0.55 times of that obtained using the conventional scheme which indicates the advantage of the LCEA technique.
  • Keywords
    CMOS digital integrated circuits; analogue-digital conversion; calibration; capacitors; low-power electronics; 12-bit cyclic ADC; CMOS process; LCEA scheme; SFDR; SNDR; calibration circuit; capacitor mismatch error; cyclic analog-to-digital converter; figure of merit; leading-subcycles capacitor error-averaging scheme; low-power feature; signal-to-noise-and-distortion ratio; size 0.35 mum; spurious-free dynamic range; voltage 3.3 V; word length 12 bit; Analog-to-digital converter (ADC); capacitor error-averaging (CEA); capacitor mismatch; low cost; low power;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2010.2062631
  • Filename
    5661851