DocumentCode
1399082
Title
Leading-Subcycles Capacitor Error-Averaging Scheme for Cyclic ADCs
Author
Kuo, Chun-Hsien ; Fan, Tso-Hung ; Kuo, Tai-Haur
Author_Institution
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Volume
60
Issue
3
fYear
2011
fDate
3/1/2011 12:00:00 AM
Firstpage
776
Lastpage
783
Abstract
This paper proposes a leading-subcycles capacitor error-averaging (LCEA) scheme to reduce the capacitor mismatch error of cyclic analog-to-digital converters (ADCs) while only slightly lowering the conversion rate. The scheme does not need complicated structures or extra calibration circuits. Hence, the proposed LCEA scheme can be used for cyclic ADCs to achieve high accuracy while maintaining their low-power and small-area features. In addition, the figure of merit (FOM) versus the number of averaging operations in a complete conversion cycle is analyzed such that power-accuracy-speed tradeoffs can be optimized. A proof of concept 12-bit cyclic ADC is implemented to compare the performance of the proposed LCEA scheme with that of a conventional cyclic ADC. The chip is fabricated in a 3.3-V, 0.35-μm CMOS process. Measurements demonstrate that the cyclic ADC with only two averaging operations has a 6 dB and 10 dB higher signal-to-noise-and-distortion ratio (SNDR) and spurious-free dynamic range (SFDR), respectively, than the conventional cyclic ADC, and with only a slightly reduced conversion rate of 12/13 times than that of the conventional cyclic ADC. In addition, the measured FOM is greatly reduced to 0.55 times of that obtained using the conventional scheme which indicates the advantage of the LCEA technique.
Keywords
CMOS digital integrated circuits; analogue-digital conversion; calibration; capacitors; low-power electronics; 12-bit cyclic ADC; CMOS process; LCEA scheme; SFDR; SNDR; calibration circuit; capacitor mismatch error; cyclic analog-to-digital converter; figure of merit; leading-subcycles capacitor error-averaging scheme; low-power feature; signal-to-noise-and-distortion ratio; size 0.35 mum; spurious-free dynamic range; voltage 3.3 V; word length 12 bit; Analog-to-digital converter (ADC); capacitor error-averaging (CEA); capacitor mismatch; low cost; low power;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2010.2062631
Filename
5661851
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