• DocumentCode
    1399548
  • Title

    A small-signal analysis of the modulation response of high-speed quantum-well lasers: effects of spectral hole burning, carrier heating, and carrier diffusion-capture-escape

  • Author

    Chin-Yi Tsai ; Shih, Fang-Ping ; Sung, Tien-Li ; Wu, Tsu-Yin ; Chen, Chih-Hsiung ; Chin-Yao Tsai

  • Author_Institution
    Dept. of Electron. & Electr. Eng., De Montfort Univ., Leicester, UK
  • Volume
    33
  • Issue
    11
  • fYear
    1997
  • fDate
    11/1/1997 12:00:00 AM
  • Firstpage
    2084
  • Lastpage
    2096
  • Abstract
    We present a small-signal analysis of the modulation response by simultaneously considering the effects of spectral hole burning, carrier heating, and carrier diffusion capture-escape. An explicit form of the small-signal modulation response is obtained and the nonlinear gain coefficients associated with each physical process are defined. Further simplifications in our results will give analytical forms for calculating the resonant frequency and damping rate of the modulation response. One of the simplified versions of our results is shown to agree with previous investigations. The effects of the carrier dephasing time, energy relaxation time, and diffusion-capture-escape times on the high-speed performance of QW lasers are theoretically investigated
  • Keywords
    carrier lifetime; high-speed optical techniques; hot carriers; laser theory; optical hole burning; optical modulation; quantum well lasers; carrier dephasing time; carrier diffusion-capture-escape; carrier heating; damping rate; diffusion-capture-escape times; energy relaxation time; high-speed performance; high-speed quantum-well lasers; modulation response; nonlinear gain coefficients; physical process; resonant frequency; small-signal analysis; spectral hole burning; Bandwidth; Charge carrier processes; Heating; Laser theory; Mirrors; Phonons; Quantum well lasers; Radiative recombination; Semiconductor lasers; Spontaneous emission;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.641324
  • Filename
    641324