DocumentCode
1401879
Title
Generalized gradual channel modeling of field-effect transistors
Author
Darling, Robert B.
Author_Institution
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
Volume
35
Issue
12
fYear
1988
fDate
12/1/1988 12:00:00 AM
Firstpage
2302
Lastpage
2314
Abstract
The flow of current in the channel of the field-effect transistor (FET) is abstracted into a generalized curvilinear coordinate system that allows the transverse and longitudinal processes to be separated. By integrating over the conducting cross section of the channel, a set of generalized channel equations is derived that formally one-dimensionalizes the analysis of a FET for a Boltzmann balance equation transport model. Two mode approximations on the curvature of the channel and the uniformity of the velocity distribution across the channel allow the system of channel equations to be reduced to an extension of the gradual channel approximation of Schockley. The applicability of the formulation is demonstrated through the modeling of a GaAs metal-semiconductor FET (MESFET) that includes all of the Boltzmann equation terms for high-field electron transport as well as a small gate-length-to-channel-thickness ratio. The results indicate that gradual channel models, with suitable geometric modifications, can be used to study FETs using higher internal fields and smaller gate/channel dimensions than previously thought
Keywords
III-V semiconductors; field effect transistors; gallium arsenide; semiconductor device models; 1D model; Boltzmann balance equation transport model; Boltzmann equation; FET; GaAs transistors; MESFET; channel current; channel curvature; conducting cross section; field-effect transistors; generalized channel equations; generalized curvilinear coordinate system; geometric modifications; gradual channel approximation of Schockley; gradual channel modeling; gradual channel models; high fields; high-field electron transport; integration over cross-section; longitudinal processes; metal-semiconductor FET; semiconductors; small dimensions; small gate-length-to-channel-thickness ratio; system of channel equations; transverse processes; two mode approximation; velocity distribution; Current density; Electrons; Equations; FETs; HEMTs; Kinetic energy; MESFETs; MODFETs; Temperature; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.8806
Filename
8806
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