• DocumentCode
    1402150
  • Title

    High voltage subnanosecond breakdown

  • Author

    Mankowski, John ; Dickens, James ; Kristiansen, Magne

  • Author_Institution
    Dept. of Electr. Eng. & Phys., Texas Tech. Univ., Lubbock, TX, USA
  • Volume
    26
  • Issue
    3
  • fYear
    1998
  • fDate
    6/1/1998 12:00:00 AM
  • Firstpage
    874
  • Lastpage
    881
  • Abstract
    Present-day ultra-wideband radiation sources produce Megavolt pulses at hundreds of picosecond (ps) risetimes. Empirical data on the breakdown characteristics for dielectric media at these short time lengths and high voltages are either extremely limited or nonexistent. In support of the design of these ultra-wideband sources, we are investigating the breakdown characteristics, at these voltages and time lengths, of several liquids and high-pressure gases. These include air, N2, H2, SF6, and transformer oil. Gap voltages attained were over 700 kV and gas pressures were over 150 atm (15 MPa). Breakdown times achieved were on the order of 600 ps. Electric field strengths observed for given breakdown times were higher than predicted by other investigators. An empirical fit is presented for the data obtained
  • Keywords
    SF6 insulation; air; air insulation; electric breakdown; gaseous insulation; high-voltage techniques; hydrogen; nitrogen; transformer oil; 15 MPa; 150 aV; 150 atm; 600 ps; 700 kV; H2; N2; SF6; air; breakdown characteristics; breakdown times; dielectric media; electric field strengths; empirical data; empirical fit; gap voltage; gas pressures; high voltage subnanosecond breakdown; high voltages; high-pressure gases; liquids; megavolt pulses; picosecond risetimes; short time lengths; time lengths; transformer oil; ultra-wideband radiation sources; ultra-wideband sources; Atmosphere; Breakdown voltage; Dielectric breakdown; Electric breakdown; Hydrogen; Impedance; Oil insulation; Pulse transformers; Testing; Ultra wideband technology;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.700858
  • Filename
    700858