DocumentCode
1403747
Title
A 3.3-V power adaptive 1244/622/155 Mbit/s transceiver for ATM, SONET/SDH
Author
Belot, Didier ; Dugoujon, Laurent ; Dedieu, S.
Author_Institution
SGS-Thomson Central R&D, Crolles, France
Volume
33
Issue
7
fYear
1998
fDate
7/1/1998 12:00:00 AM
Firstpage
1047
Lastpage
1058
Abstract
This paper presents the implementation of a multirate 155-, 622-, or 1244-Mbit/s transceiver for ATM and SDH/SONET in a 0.5-μm BiCMOS. The internal high-speed clock generation is based on PLL´s with 1.24-GHz VCO´s. The solutions presented here allow us to get rid of the external trimming of the free-running frequency of VCO. The automatic adjustment of the clock and data recovery PLL VCO free running is performed, and thus, increases the robustness of the RX function without expenses in manual trimming. The architecture of this transceiver is thought to enable the full-frequency Wafer test of the whole core by specific loop-back modes. As the same core is used for 155-Mbit/s, 622-Mbit/s, and 1.2-Gbit/s power adaptation techniques are implemented which lead to a 660-mW consumption for 155-Mbit/s operation and 1.1 W for 1.24 Gbits/s. A specific digitally programmable power adaptive ECL cell library concept is presented. Noise precautions are also described, as well as an analog HDL top-down methodology developed by SGS-Thomson Central R&D to short-down the development time and increase reusability
Keywords
BiCMOS integrated circuits; SONET; asynchronous transfer mode; synchronous digital hierarchy; transceivers; 0.5 micron; 1.1 W; 1244 Mbit/s; 155 Mbit/s; 3.3 V; 622 Mbit/s; 660 mW; ATM; BiCMOS IC; PLL; RX function; SONET/SDH; VCO; analog HDL; clock generation; data recovery; digitally programmable power adaptive ECL cell; full-frequency wafer test; loop-back mode; multirate transceiver; noise; power management; BiCMOS integrated circuits; Clocks; Frequency; Phase locked loops; Robustness; SONET; Synchronous digital hierarchy; Testing; Transceivers; Voltage-controlled oscillators;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/4.701256
Filename
701256
Link To Document