• DocumentCode
    1403757
  • Title

    Degradation of the Conducted Radio Frequency Immunity of Microcontrollers Due to Electromagnetic Resonances in Foot-Point Loops

  • Author

    Tao Su ; Unger, Michael ; Steinecke, Thomas ; Weigel, Robert

  • Author_Institution
    Sch. of Phys. & Eng., Sun Yat-sen Univ., Guangzhou, China
  • Volume
    54
  • Issue
    4
  • fYear
    2012
  • Firstpage
    772
  • Lastpage
    784
  • Abstract
    The response of the microcontrollers to conducted radio frequency interference depends strongly on the frequency of the interference signals. As a symbol of the strong frequency dependence, dips appear on the immunity-frequency curve of the microcontrollers. This paper discovers that some of the immunity dips are due to resonances in the current loops through the input and output pins of the oscillator amplifier. Those dips are called foot-point immunity dips. With theoretical analysis, measurements, simulations, and optimizations, this paper gives a systematic description and treatment on the foot-point immunity dips.
  • Keywords
    amplifiers; microcontrollers; oscillators; radiofrequency interference; conducted radiofrequency immunity degradation; electromagnetic resonances; foot-point immunity dips; foot-point loops; immunity-frequency curve; interference signals; microcontrollers; oscillator amplifier; radiofrequency interference; Electromagnetic compatibility; electromagnetic interference (EMI); integrated circuits (ICs); microcontrollers; oscillators;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2011.2178098
  • Filename
    6109339