• DocumentCode
    1403970
  • Title

    Experimental Demonstration of an Interferometric Technique for Characterizing the Full Optical Behavior of Multi-Mode Power Detectors

  • Author

    Thomas, Christopher N. ; Withington, Stafford

  • Author_Institution
    Dept. of Phys., Cambridge Univ., Cambridge, UK
  • Volume
    2
  • Issue
    1
  • fYear
    2012
  • Firstpage
    50
  • Lastpage
    60
  • Abstract
    An experimental method is presented for characterizing the full optical behavior of few-mode power detectors. The technique involves illuminating the detector with a pair of coherent sources. When the phase of one source is rotated relative to the other, the detector output displays a fringe. Measurement of the complex amplitude of this fringe allows an element of a two-point optical response function to be recovered. By repeating the process for different source positions and orientations, the full two-point response function can be mapped out. From this function it is possible to obtain the full spatial form of each of the modes of the field in which the detector is incoherently sensitive to power, along with the responsivity to the power carried by each of these modes. We describe a scanning system assembled for performing such measurements at frequencies in the range 195-270 GHz. Results will be presented for measurements made on a detector that was stopped down to simulate and a few-mode planar absorber.
  • Keywords
    image sensors; light absorption; light interferometry; optical testing; coherent source; few mode planar absorber; fewmode power detector; fringe pattern; interferometric technique; multimode power detectors; scanning system; two point optical response function; Detectors; Extraterrestrial measurements; Optical detectors; Optical surface waves; Optical variables measurement; Probes; Detectors; far-infrared; modes; optical measurements; submillimeter; terahertz;
  • fLanguage
    English
  • Journal_Title
    Terahertz Science and Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-342X
  • Type

    jour

  • DOI
    10.1109/TTHZ.2011.2177693
  • Filename
    6109369