• DocumentCode
    1404858
  • Title

    A critical evaluation of the effective diffusion length determination in crystalline silicon solar cells from an extended spectral analysis

  • Author

    Keller, Steffen ; Spiegel, Markus ; Fath, Peter ; Willeke, Gerhard P. ; Bucher, Ernst

  • Author_Institution
    Fak. fur Phys., Konstanz Univ., Germany
  • Volume
    45
  • Issue
    7
  • fYear
    1998
  • fDate
    7/1/1998 12:00:00 AM
  • Firstpage
    1569
  • Lastpage
    1574
  • Abstract
    This note draws attention to possible errors when characterizing silicon solar cells by means of the effective minority carrier diffusion length Lb as defined in the paper on “Numerical modeling of textured silicon solar cells using PC1D” by Basore (1990). The approximations underlying the analytical expression for L eff are critically reviewed. Their impact on the determination of the minority carrier bulk diffusion length Lb from Leff is discussed for a 250-μm thick Si solar cell. It is found that considerable errors occur in the case of diffusion lengths larger than the cell thickness even when neglecting any measurement uncertainty
  • Keywords
    carrier lifetime; elemental semiconductors; minority carriers; silicon; solar cells; spectral analysis; PC1D; Si; measurement errors; minority carrier diffusion length; numerical model; spectral analysis; textured crystalline silicon solar cell; Crystallization; Measurement uncertainty; Photovoltaic cells; Radiative recombination; Short circuit currents; Silicon; Solar power generation; Space charge; Spectral analysis; Velocity measurement;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.701490
  • Filename
    701490