• DocumentCode
    1407436
  • Title

    Body-Bias-Driven Design Strategy for Area- and Performance-Efficient CMOS Circuits

  • Author

    Meijer, Maurice ; De Gyvez, José Pineda

  • Author_Institution
    Central R&D Div., NXP Semicond., Eindhoven, Netherlands
  • Volume
    20
  • Issue
    1
  • fYear
    2012
  • Firstpage
    42
  • Lastpage
    51
  • Abstract
    Worst-case design uses extreme process corner conditions which rarely occur. This limits maximum speed specifications and costs additional power due to area over-dimensioning during synthesis. We present a new design synthesis strategy for digital CMOS circuits that makes use of forward body biasing. Our approach renders consistently a better performance-per-area ratio by constraining circuit over-dimensioning without sacrificing circuit performance. An in-depth analysis of the body-bias-driven design theory is provided. It is complemented by an algorithm that enables fast reconstruction of the area-clock period tradeoff curve of the design. We validated these new concepts through industrial processor designs in 90-nm low-power CMOS. For standard- Vth implementations, we observed performance-per-area improvements up to 40%, area and leakage reductions up to 30%, and dynamic power savings of up to 10% without performance penalties as a benefit from our proposed body-bias-driven design strategy. The benefits are larger for high-Vth implementations. In this case, we observed performance-per-area improvements up to 90%, area and leakage reductions up to 40%, and dynamic power savings of up to 25% without performance penalties.
  • Keywords
    CMOS digital integrated circuits; circuit optimisation; circuit tuning; logic design; area and performance efficient CMOS circuits; body bias driven design strategy; circuit optimization; circuit tuning; digital CMOS circuits; forward body biasing; industrial processor designs; size 90 nm; worst case design; CMOS integrated circuits; Clocks; Delay; Integrated circuit modeling; Logic circuits; Logic gates; Power demand; CMOS digital integrated circuits; Circuit optimization; circuit tuning; logic design;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2010.2091974
  • Filename
    5671527