• DocumentCode
    1408431
  • Title

    Modeling burst channels using partitioned Fritchman´s Markov models

  • Author

    Pimentel, Cecilio ; Blake, Ian F.

  • Author_Institution
    Dept. of Electron. & Syst., Univ. Fed. de Pernambuco, Recife, Brazil
  • Volume
    47
  • Issue
    3
  • fYear
    1998
  • fDate
    8/1/1998 12:00:00 AM
  • Firstpage
    885
  • Lastpage
    899
  • Abstract
    Discrete models based on functions of Markov chains (also referred to as hidden Markov models or finite-state channel (FSC) models) have been used to characterize the error process in communication channels with memory. One important property of these models is that the probability of any observed sequence can be expressed as a linear combination of the probability of a finite set of sequences of finite length, the so-called basis sequences. In this paper, we express the parameters of a class of FSC models as a simple function of the probability of the basis sequences. Based on this approach, we propose a new method for the parameterization of the Fritchman (1967) channel with single-error state as well as the interesting cases of Fritchman channels with more than one error state and the Gilbert-Elliott channel ((GEC) nonrenewal models). To illustrate the method, FSC models for the nonfrequency-selective Rician fading channel are presented. The number of states and the probability of state transitions are estimated for a given set of fading parameters
  • Keywords
    Rician channels; error analysis; fading; hidden Markov models; probability; sequences; telecommunication channels; FSC models; Fritchman channels; GEC nonrenewal models; Gilbert-Elliott channel; Markov chains; basis sequences; burst channels; communication channels; discrete models; error process; fading; finite-state channel models; hidden Markov models; linear combination; nonfrequency-selective Rician fading channel; observed sequence; probability; single-error state; state transitions; Analytical models; Brazil Council; Communication channels; Digital communication; Fading; Helium; Hidden Markov models; Power capacitors; Rician channels; State estimation;
  • fLanguage
    English
  • Journal_Title
    Vehicular Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9545
  • Type

    jour

  • DOI
    10.1109/25.704842
  • Filename
    704842