• DocumentCode
    1409427
  • Title

    Modeling, analysis, simulation, scheduling, and control of semiconductor manufacturing systems: A Petri net approach

  • Author

    Mengchu Zhou

  • Author_Institution
    Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ
  • Volume
    11
  • Issue
    3
  • fYear
    1998
  • fDate
    8/1/1998 12:00:00 AM
  • Firstpage
    333
  • Lastpage
    357
  • Abstract
    This paper presents a Petri net approach to modeling, analysis, simulation, scheduling, and control of semiconductor manufacturing systems. These systems can be characterized as discrete event systems that exhibit sequential, concurrent, and conflicting relations among the events and operations. Their evolution is dynamic over time. The system complexity is tremendous owing to the complex semiconductor manufacturing processes and test procedures. A formal approach such as Petri nets enables one to describe such complex discrete event systems precisely and thus allows one to perform both qualitative and quantitative analysis, scheduling and discrete-event control of them. This paper also serves as a tutorial paper. It briefly reviews applications of Petri nets in semiconductor manufacturing automation. It then introduces definitions and concepts of Petri nets. It proceeds with a discussion of basic Petri net modules in system modeling, a modeling method and a practical system´s modeling example. Next, the paper presents their properties and their implications in manufacturing systems, as well as their analysis methods. Timed Petri nets are introduced for system simulation, performance evaluation, and scheduling purposes. An application-oriented case study is presented. Finally, the paper concludes with the active research areas in applying Petri nets to design of semiconductor manufacturing systems
  • Keywords
    Petri nets; discrete event systems; production control; semiconductor device manufacture; semiconductor process modelling; Petri net; analysis; automation; control; discrete event system; modeling; scheduling; semiconductor manufacturing system; simulation; Analytical models; Discrete event systems; Job shop scheduling; Manufacturing processes; Manufacturing systems; Modeling; Performance analysis; Petri nets; Semiconductor device testing; System testing;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/66.705370
  • Filename
    705370