• DocumentCode
    1409630
  • Title

    Exact symbol and bit error probabilities of linearly modulated signals with maximum ratio combining diversity in frequency nonselective Rician and Rayleigh fading channels

  • Author

    Shayesteh, Mahrokh G.

  • Author_Institution
    Dept. of Electr. Eng., Urmia Univ., Urmia, Iran
  • Volume
    5
  • Issue
    1
  • fYear
    2011
  • fDate
    1/1/2011 12:00:00 AM
  • Firstpage
    12
  • Lastpage
    26
  • Abstract
    The exact symbol and bit error probabilities of linearly modulated signals in frequency non-selective Rician fading channels with Lth diversity branches are derived, where coherent detection with maximum ratio combining (MRC) is used at the receiver. For performance evaluation, the multiplicative distortion is combined with the additive Gaussian noise and form an additive noise is formed. This method allows computing the exact symbol and bit error probabilities of M-ary phase shift keying (M-PSK), M-ary quadrature amplitude modulation (M-QAM), M-ary amplitude modulation (M-AM) and M-ary amplitude modulation phase modulation (M-AMPM) for any arbitrary bit mappings. The results contain several versions of one simple integral. The error probabilities are also obtained for Rayleigh channel, which is a special case of Rice channel. Further, the results for Nakagami-m channel with the integer parameter are found. The results quite match with the previous ones while having simple forms. Also, for some unsolved cases, the exact error probabilities are presented. Simulations are carried out to verify the analytical evaluations.
  • Keywords
    Nakagami channels; Rayleigh channels; diversity reception; error statistics; probability; quadrature amplitude modulation; M-PSK; M-QAM; Nakagami-m channel; Rayleigh fading channels; additive Gaussian noise; bit error probabilities; diversity; frequency nonselective Rician fading channels; integer parameter; linearly modulated signals; maximum ratio combining;
  • fLanguage
    English
  • Journal_Title
    Communications, IET
  • Publisher
    iet
  • ISSN
    1751-8628
  • Type

    jour

  • DOI
    10.1049/iet-com.2010.0149
  • Filename
    5672989