DocumentCode
1410218
Title
Semiconductor Surface Thermocouples for Determining Heat-Transfer Rates
Author
Kendall, David N. ; Dixon, W.Paul ; Schulte, Edward H.
Author_Institution
McDonnell Douglas Corporation, St. Louis, Mo.
Issue
4
fYear
1967
fDate
7/1/1967 12:00:00 AM
Firstpage
596
Lastpage
603
Abstract
Possible methods of increasing the sensitivity capabilities for determining heat-transfer rates associated with wind tunnel testing have been investigated. Techniques utilizing surface thermocouples of conventional thermocouple materials do not provide the necessary temperature sensitivity to low heat-transfer rates. This need for increased sensitivity has resulted in development and evaluation of surface thermocouples fabricated from semiconductor materials. Calibration of the semiconductor surface thermocouple has disclosed temperature sensitivity on the order of 35 times that of chromel-constantan thermocouples. This increased sensitivity has established confidence in the potential value of this concept and further investigation and evaluation are presently being conducted.
Keywords
Heat transfer; Instruments; Pollution measurement; Semiconductor thin films; Sputtering; Substrates; Surface resistance; Temperature sensors; Thermal conductivity; Thermal resistance; Fast response; heat-transfer; instrumentation; semiconductor; surface; thermocouple; wind tunnel;
fLanguage
English
Journal_Title
Aerospace and Electronic Systems, IEEE Transactions on
Publisher
ieee
ISSN
0018-9251
Type
jour
DOI
10.1109/TAES.1967.5408836
Filename
5408836
Link To Document