• DocumentCode
    1410218
  • Title

    Semiconductor Surface Thermocouples for Determining Heat-Transfer Rates

  • Author

    Kendall, David N. ; Dixon, W.Paul ; Schulte, Edward H.

  • Author_Institution
    McDonnell Douglas Corporation, St. Louis, Mo.
  • Issue
    4
  • fYear
    1967
  • fDate
    7/1/1967 12:00:00 AM
  • Firstpage
    596
  • Lastpage
    603
  • Abstract
    Possible methods of increasing the sensitivity capabilities for determining heat-transfer rates associated with wind tunnel testing have been investigated. Techniques utilizing surface thermocouples of conventional thermocouple materials do not provide the necessary temperature sensitivity to low heat-transfer rates. This need for increased sensitivity has resulted in development and evaluation of surface thermocouples fabricated from semiconductor materials. Calibration of the semiconductor surface thermocouple has disclosed temperature sensitivity on the order of 35 times that of chromel-constantan thermocouples. This increased sensitivity has established confidence in the potential value of this concept and further investigation and evaluation are presently being conducted.
  • Keywords
    Heat transfer; Instruments; Pollution measurement; Semiconductor thin films; Sputtering; Substrates; Surface resistance; Temperature sensors; Thermal conductivity; Thermal resistance; Fast response; heat-transfer; instrumentation; semiconductor; surface; thermocouple; wind tunnel;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9251
  • Type

    jour

  • DOI
    10.1109/TAES.1967.5408836
  • Filename
    5408836