DocumentCode
1411169
Title
VLSI, MCM, and WSI: a design comparison
Author
Swartzlander, Earl E., Jr.
Author_Institution
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Volume
15
Issue
3
fYear
1998
Firstpage
28
Lastpage
34
Abstract
Three IC technologies result in different outcomes-performance and cost-in two case studies. The author compares their designs in terms of silicon area, substrate size, and power consumption
Keywords
VLSI; integrated circuit technology; multichip modules; wafer-scale integration; IC technologies; MCM; VLSI; WSI; cost; performance; power consumption; silicon area; substrate size; Bonding; Central Processing Unit; Centralized control; Energy consumption; Integrated circuit testing; Process control; Random access memory; Read-write memory; Silicon; Very large scale integration;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/54.706030
Filename
706030
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