• DocumentCode
    1412001
  • Title

    Multidisciplinary Approach for Robust Package Design of MEMS Accelerometers

  • Author

    Wen, Jian ; Sarihan, Vijay ; Myers, Bill ; Li, Gary

  • Author_Institution
    Packaging Solution Div., Freescale Semicond., Tempe, AZ, USA
  • Volume
    1
  • Issue
    12
  • fYear
    2011
  • Firstpage
    1934
  • Lastpage
    1938
  • Abstract
    Micro-electro-mechanical systems (MEMS) packaging is becoming increasingly critical and plays a major role in the successful commercialization of MEMS products. The packaging system should enable the MEMS to perform the sensing function and at the same time protect it from environmental exposure. The design of the package should be robust enough to be able to withstand minor handling and manufacturing induced defects. Failures due to these defects are not unusual, one of our accelerometers in a small outline integrated circuit package has experienced a low ppm occurrence of device fracture. A multidisciplinary approach inclusive of vibration analysis, electrical response determination, stress analysis, and fracture mechanics are utilized to determine the appropriate package design. It is demonstrated here on a MEMS package for automotive airbag deployment. Along with the usual temperature exposure, this package also has to withstand a harsh vibration environment. The package is designed to avoid exciting MEMS resonance frequency to protect the transducer from sticking or clipping. At the same time, it delivers a reliable and intact transducer with no device fracture failures or output signal offset.
  • Keywords
    accelerometers; electronics packaging; fracture mechanics; micromechanical devices; stress analysis; vibrations; MEMS accelerometers; MEMS products; device fracture; electrical response determination; fracture mechanics; manufacturing induced defects; micro-electro-mechanical systems packaging; multidisciplinary approach; packaging system; robust package design; stress analysis; vibration analysis; Materials; Microassembly; Micromechanical devices; Resonant frequency; Sensors; Stress; Transducers; Fracture mechanics; MEMS; package design; reliability;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2011.2164406
  • Filename
    6119119