• DocumentCode
    141331
  • Title

    ETD: An extended time delay algorithm for ventricular fibrillation detection

  • Author

    Jungyoon Kim ; Chao-Hsien Chu

  • Author_Institution
    iCity Lab. of Singapore Manage. Univ., Singapore, Singapore
  • fYear
    2014
  • fDate
    26-30 Aug. 2014
  • Firstpage
    6479
  • Lastpage
    6482
  • Abstract
    Ventricular fibrillation (VF) is the most serious type of heart attack which requires quick detection and first aid to improve patients´ survival rates. To be most effective in using wearable devices for VF detection, it is vital that the detection algorithms be accurate, robust, reliable and computationally efficient. Previous studies and our experiments both indicate that the time-delay (TD) algorithm has a high reliability for separating sinus rhythm (SR) from VF and is resistant to variable factors, such as window size and filtering method. However, it fails to detect some VF cases. In this paper, we propose an extended time-delay (ETD) algorithm for VF detection and conduct experiments comparing the performance of ETD against five good VF detection algorithms, including TD, using the popular Creighton University (CU) database. Our study shows that (1) TD and ETD outperform the other four algorithms considered and (2) with the same sensitivity setting, ETD improves upon TD in three other quality measures for up to 7.64% and in terms of aggregate accuracy, the ETD algorithm shows an improvement of 2.6% of the area under curve (AUC) compared to TD.
  • Keywords
    cardiology; delays; medical disorders; patient monitoring; Creighton University database; ETD algorithm; extended time delay algorithm; heart attack; patient survival rates; sinus rhythm; ventricular fibrillation detection; wearable devices; Algorithm design and analysis; Classification algorithms; Detection algorithms; Electrocardiography; Fibrillation; Heart rate; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2014.6945112
  • Filename
    6945112