DocumentCode
1415928
Title
BiCMOS thermal sensor circuit for built-in test purposes
Author
Altet, J. ; Rubio, A. ; Dilhaire, S. ; Schaub, E. ; Claeys, W.
Author_Institution
Dept. of Electron. Eng., Univ. Politecnica de Catalunya, Barcelona, Spain
Volume
34
Issue
13
fYear
1998
fDate
6/25/1998 12:00:00 AM
Firstpage
1307
Lastpage
1309
Abstract
New difficulties have arisen in integrated circuit (IC) testing due to trends in technological development. Alternatives to traditional circuit testing techniques are appearing, such as thermal testing. The authors present a new built-in IC-surface differential thermal sensor. The sensor, analysis, implementation on a BiCMOS specific integrated circuit, and experimental measurements show the viability of temperature sensing for testing purposes
Keywords
BiCMOS integrated circuits; built-in self test; integrated circuit testing; temperature sensors; BiCMOS IC; IC testing; IC-surface differential thermal sensor; built-in test purposes; technological development trends; thermal sensor circuit; thermal testing;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19980947
Filename
707208
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