DocumentCode
1416678
Title
Improved direct-modulation characteristics of a semiconductor laser by FM/IM conversion through an interferometer
Author
Yabre, Gnitabouré
Author_Institution
Lab. RESO, Ecole Nat. d´´Ingenieurs de Brest, France
Volume
14
Issue
10
fYear
1996
fDate
10/1/1996 12:00:00 AM
Firstpage
2135
Lastpage
2140
Abstract
The behavior of the light signal converted by means of a Mach-Zehnder interferometer is analyzed under the assumption of a three-tone modulation of the emitting laser source. Illustrations are given of the signal at the interferometer output, showing the frequency response, the second- and third-order intermodulation distortions (IMDs), with a direct comparison between intensity modulation (IM) and optical frequency modulation (FM). The FM characteristics are plotted for the different cases where the spurious IM component and the term of chirp formula involving the gain compression factor are taken into account or not. Successful results are obtained in agreement with previous studies. In addition, this work shows that the FM-to-IM signal would exhibit lower distortion levels than the conventional direct IM, placing less stringent requirements on the laser linearity
Keywords
Mach-Zehnder interferometers; chirp modulation; electro-optical modulation; frequency modulation; frequency response; intermodulation distortion; optical fibre subscriber loops; optical transmitters; semiconductor lasers; FM characteristics; FM-to-IM signal; FM/IM conversion; Mach-Zehnder interferometer; chirp formula; emitting laser source; frequency response; gain compression factor; improved direct-modulation characteristics; intensity modulation; interferometer; interferometer output; laser linearity; light signal convertion; lower distortion levels; optical frequency modulation; second-order intermodulation distortions; semiconductor laser; spurious IM component; third-order intermodulation distortions; three-tone modulation; Frequency modulation; Frequency response; Intensity modulation; Intermodulation distortion; Laser noise; Optical interferometry; Optical modulation; Semiconductor lasers; Signal analysis; Stimulated emission;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/50.541200
Filename
541200
Link To Document