• DocumentCode
    1417963
  • Title

    Simulation of semiconductor devices using a Galerkin/spherical harmonic expansion approach to solving the coupled Poisson-Boltzmann system

  • Author

    Rahmat, Khalid ; White, Jacob ; Antoniadis, Dimitri A.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
  • Volume
    15
  • Issue
    10
  • fYear
    1996
  • fDate
    10/1/1996 12:00:00 AM
  • Firstpage
    1181
  • Lastpage
    1196
  • Abstract
    This paper describes a Galerkin/spherical harmonics approach for solving the coupled Poisson-Boltzmann system of equations for the electron distribution function and the electric potential, which can then be used to calculate other parameters of interest such as current flow and electron temperature. The Galerkin approach described here has some pragmatic advantages in space-dependent problems over more commonly used term-matching techniques for arbitrary order spherical harmonic expansions in momentum space, but the method requires a careful treatment of the boundary conditions and upwinded discretization methods. Results are presented for nonuniformly doped one-dimensional devices using up to third order spherical harmonics to show the importance of including higher order harmonics to accurately calculate the distribution function in high field regions
  • Keywords
    Boltzmann equation; Galerkin method; harmonic analysis; semiconductor device models; Galerkin method; boundary conditions; coupled Poisson-Boltzmann equation; current flow; electric potential; electron distribution function; electron temperature; nonuniformly doped one-dimensional device; semiconductor device; simulation; spherical harmonic expansion; upwinded discretization; Boltzmann equation; Boundary conditions; Distribution functions; Electric potential; Electrons; Jacobian matrices; Laboratories; Moment methods; Poisson equations; Semiconductor devices;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.541439
  • Filename
    541439