• DocumentCode
    1418900
  • Title

    Evanescent Semiconductor Active Optical Isolators for Low Insertion Loss and High Gain Saturation Power

  • Author

    Shimizu, Hiromasa ; Goto, Syunsuke

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Tokyo Univ. of Agric. & Technol., Tokyo, Japan
  • Volume
    28
  • Issue
    9
  • fYear
    2010
  • fDate
    5/1/2010 12:00:00 AM
  • Firstpage
    1414
  • Lastpage
    1419
  • Abstract
    We have designed evanescent semiconductor active optical isolators to realize lower forward transparent current in transverse electric (TE) mode integrable semiconductor active optical isolators with 9.3 dB/mm optical isolation. Evanescent semiconductor active optical isolators are composed of a semiconductor optical amplifier waveguide with an InGaAsP waveguide layers having an Fe layer at its sidewall upon an MQW active layer, allowing TE-mode optical isolation to be realized without etching the MQW active layer unlike conventional TE-mode semiconductor active optical isolators. Evanescent-mode optical isolators enable higher internal quantum efficiency and lower transparent current, compared with conventional TE-mode optical isolators. Furthermore, it was found that the evanescent-mode optical isolators had higher 3 dB saturation output power.
  • Keywords
    gallium arsenide; indium compounds; optical isolators; optical waveguides; semiconductor optical amplifiers; Fe; InGaAsP; MQW active layer; TE-mode semiconductor active optical isolators; evanescent semiconductor active optical isolators; evanescent-mode optical isolators; high gain saturation power; low insertion loss; semiconductor optical amplifier waveguide; transverse electric mode integrable semiconductor active optical isolators; waveguide layers; Evanescent waveguide; Fe; InGaAsP; gain saturation; nonreciprocal loss; optical isolator; photonic integrated circuit; semiconductor optical amplifiers;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2010.2042787
  • Filename
    5415584