• DocumentCode
    1421523
  • Title

    Population-inversion and gain estimates for a semiconductor TASER

  • Author

    Harrison, P. ; Soref, R.A.

  • Author_Institution
    Inst. of Microwaves & Photonics, Leeds Univ., UK
  • Volume
    37
  • Issue
    1
  • fYear
    2001
  • fDate
    1/1/2001 12:00:00 AM
  • Firstpage
    153
  • Lastpage
    158
  • Abstract
    We have investigated a solid-state design advanced (see Soref et al. in SPIE Proceedings, vol.3795, p.516, 1999) to achieve a terahertz-amplification-by-the-stimulated-emission-of-radiation (TASER). The original design was based on light-to heavy-hole intersubband transitions in SiGe-Si heterostructures. This work adapts the design to electron intersubband transitions in the more readily available GaAs/Ga 1-xAlxAs material system. It is found that the electric-field induced anti-crossings of the states, derived from the first excited state with the ground states of a superlattice in the Stark-ladder regime, offers the possibility of a population inversion and gain at room temperature
  • Keywords
    III-V semiconductors; aluminium compounds; excited states; gallium arsenide; ground states; population inversion; semiconductor lasers; semiconductor superlattices; stimulated emission; submillimetre wave lasers; GaAs-GaAlAs; GaAs/Ga1-xAlxAs material system; SiGe-Si; SiGe/Si heterostructures; e Stark-ladder regime; electric-field induced anti-crossings; electron intersubband transitions; excited state; ground states; laser gain; light-to heavy-hole intersubband transitions; population inversion; population-inversion; room temperature; semiconductor TASER; solid-state design; superlattice; terahertz-amplification-by-the-stimulated-emission-of-radiation; Electrons; Force sensors; Gallium arsenide; Germanium silicon alloys; Laboratories; Optical materials; Quantum cascade lasers; Semiconductor superlattices; Silicon germanium; Solid state circuits;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.892737
  • Filename
    892737