• DocumentCode
    1424266
  • Title

    Effectiveness of microarchitecture test program generation

  • Author

    Utamaphethai, Noppanunt ; Blanton, R. D Shawn ; Shen, John Paul

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • Volume
    17
  • Issue
    4
  • fYear
    2000
  • Firstpage
    38
  • Lastpage
    49
  • Abstract
    Investigation of a list of design errors typically encountered in industry is undertaken to determine if our microarchitecture test programs can detect them. Two metrics, functional and timing deviation are used to determine design error coverage
  • Keywords
    computer architecture; computer testing; microcomputers; design error coverage; design errors; metrics; microarchitecture; test program generation; Algorithm design and analysis; Circuit testing; Computer errors; Explosions; Formal verification; Logic circuits; Microarchitecture; Microprocessors; Pipelines; Timing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.895005
  • Filename
    895005
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1424266