• DocumentCode
    142446
  • Title

    Effects of process learning and product lifecycle on risk-based quality control plans

  • Author

    Bettayeb, Belgacem ; Bassetto, Samuel-Jean

  • Author_Institution
    Dept. of Math. & Ind. Eng., Montreal Polytech., Montreal, QC, Canada
  • fYear
    2014
  • fDate
    March 31 2014-April 3 2014
  • Firstpage
    505
  • Lastpage
    510
  • Abstract
    This paper studies the effects of process learning and product lifecycle phenomena on risk-based quality control plans (RBQCP) in the context of job shop manufacturing systems. The risk-based approach is tested and evaluated through several configurations representative of the dynamics of the aforementioned phenomena. The results confirm the robustness of the risk-based approach and underline the importance of managing products´ lifecycles in accordance with the available inspection resources and a threshold of risk exposure judiciously predefined.
  • Keywords
    inspection; job shop scheduling; learning (artificial intelligence); manufacturing systems; planning; product life cycle management; production engineering computing; quality control; risk management; RBQCP; dynamics configurations representative; inspection resources; job shop manufacturing systems; process learning; product lifecycle management; risk exposure; risk-based approach; risk-based quality control plans; Inspection; Integrated circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems Conference (SysCon), 2014 8th Annual IEEE
  • Conference_Location
    Ottawa, ON
  • Print_ISBN
    978-1-4799-2087-7
  • Type

    conf

  • DOI
    10.1109/SysCon.2014.6819303
  • Filename
    6819303