• DocumentCode
    1426980
  • Title

    A \\hbox {Gb/s}+ Slew-Rate/Impedance-Controlled Output Driver With Single-Cycle Compensation Time

  • Author

    Kwak, Young-Ho ; Jung, Inhwa ; Kim, Chulwoo

  • Author_Institution
    Korea Univ., Seoul, South Korea
  • Volume
    57
  • Issue
    2
  • fYear
    2010
  • Firstpage
    120
  • Lastpage
    125
  • Abstract
    This brief introduces a low-noise slew-rate/impedance-controlled high-speed output driver in 0.18-¿m CMOS process. The output driver adopts an open-loop structure that enables the system to take only a single cycle to control the signal slew-rate or driver impedance. The control blocks consume 4.907 mA at 1 Gb/s. The proposed output driver is designed to maintain the data slew rate in the range of 2.1-3.6 V/ns. The proposed scheme is also applied to a pseudo-open-drain output driver, and the maximum and minimum variations of the impedance are +1.78% and -1.30%, respectively.
  • Keywords
    CMOS integrated circuits; compensation; driver circuits; open loop systems; CMOS process; bit rate 1 Gbit/s; current 4.907 mA; high-speed output driver; impedance controlled output driver; low-noise slew-rate driver; open loop structure; pseudoopen-drain output driver; single-cycle compensation time; size 0.18 mum; Circuit noise; Circuit testing; Crosstalk; Driver circuits; Impedance; Open loop systems; Phase locked loops; Semiconductor device noise; Signal generators; Temperature; Electromagnetic interference (EMI); fast compensation; low power; process, voltage, and temperature (PVT) variation detection; slew rate;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2009.2038631
  • Filename
    5420307