DocumentCode

1427114

Title

Editorial: New EIC Introduction

Author

Bowyer, Kevin

Volume

22

Issue

12

fYear

2000

Firstpage

1345

Lastpage

1346

fLanguage

English

Journal_Title

Pattern Analysis and Machine Intelligence, IEEE Transactions on

Publisher

ieee

ISSN

0162-8828

Type

jour

DOI

10.1109/TPAMI.2000.895969

Filename

895969