• DocumentCode
    1427313
  • Title

    A compact on-chip ECC for low cost flash memories

  • Author

    Tanzawa, Toru ; Tanaka, Tomoharu ; Takeuchi, Ken ; Shirota, Riichiro ; Aritome, Seiichi ; Watanabe, Hiroshi ; Hemink, Gertjan ; Shimizu, Kazuhiro ; Sato, Shinji ; Takeuchi, Yuji ; Ohuchi, Kazunori

  • Author_Institution
    Microelectron. Eng. Lab., Toshiba Corp., Kawasaki, Japan
  • Volume
    32
  • Issue
    5
  • fYear
    1997
  • fDate
    5/1/1997 12:00:00 AM
  • Firstpage
    662
  • Lastpage
    669
  • Abstract
    A compact on-chip error correcting circuit (ECC) for low cost flash memories has been developed. The total increase in chip area is 2%, including all cells, sense amplifiers, logic, and wiring associated with the ECC. The proposed on-chip ECC, employing 10 check bits for 512 data bits, has been implemented on an experimental 64M-bit NAND flash memory. The cumulative sector error rate has been improved from 10-4 to 10-10. By transferring read data from the sense amplifiers to the ECC twice, 522-Byte temporary buffers, which are required for the conventional ECC and occupy a large part of the ECC area, have been eliminated. As a result, the area for the circuit has been drastically reduced by a factor of 25. The proposed on-chip ECC has been optimized in consideration of balance between the reliability improvement and the cell area overhead. The power increase has been suppressed to less than 1 mA
  • Keywords
    CMOS memory circuits; EPROM; NAND circuits; cellular arrays; circuit optimisation; error correction; fault diagnosis; integrated circuit reliability; 64 Mbit; NAND flash memory; cell area overhead; chip area; cumulative sector error rate; error correcting circuit; on-chip ECC; read data; reliability improvement; sense amplifiers; twin-well CMOS double-polysilicon single-metal technology; Circuits; Costs; Electrons; Error analysis; Error correction; Error correction codes; Flash memory; Logic; Nonvolatile memory; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.568829
  • Filename
    568829