• DocumentCode
    1427947
  • Title

    A Sensitivity Analysis Method for Equivalent Parameter Extraction of Transient Magnetic Field With Internal Circuits

  • Author

    Ho, S.L. ; Niu, Shuangxia ; Fu, W.N. ; Zhu, JianGuo

  • Author_Institution
    Dept. of Electr. Eng., Hong Kong Polytech. Univ., Hong Kong, China
  • Volume
    48
  • Issue
    2
  • fYear
    2012
  • Firstpage
    295
  • Lastpage
    298
  • Abstract
    A sensitivity analysis method for the equivalent parameter extraction of transient magnetic field problems with internally coupled circuits is presented. In contrast to conventional methods using physical meaning and physical relationships for parameter extraction, this method is based on a collection of mathematical system equations which include transient magnetic field equations and internal circuit equations. The extracted parameters include the collective effects of eddy currents, internal circuits, and mechanical motion. Compared with previous sensitivity analysis methods which extract only the equivalent inductance, the proposed algorithm extracts also the equivalent resistance. A laminated transformer with internal circuit is reported to validate and showcase the proposed method.
  • Keywords
    eddy currents; finite element analysis; inductance; laminations; parameter estimation; sensitivity analysis; transformers; collective effects; eddy currents; equivalent inductance; equivalent parameter extraction; equivalent resistance; finite-element method; internally coupled circuits; laminated transformer; mathematical system equations; mechanical motion; parameter extraction; sensitivity analysis method; transient magnetic field equations; transient magnetic field problems; Couplings; Equations; Magnetic circuits; Mathematical model; Resistance; Transient analysis; Windings; Electric circuit; equivalent parameter; finite-element method; indirect coupling; sensitivity; transient magnetic field;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2011.2173912
  • Filename
    6136575