• DocumentCode
    1428295
  • Title

    Fabrication of silicon and oxide membranes over cavities using ion-cut layer transfer

  • Author

    Yun, Chang-Han ; Cheung, Nathan W.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • Volume
    9
  • Issue
    4
  • fYear
    2000
  • Firstpage
    474
  • Lastpage
    477
  • Abstract
    Silicon and oxide membranes were fabricated using an ion-cut layer transfer process, which is suitable for sub-micron-thick membrane fabrication with good thickness uniformity and surface micro-roughness. After hydrogen ions were implanted into a silicon wafer, the implanted wafer was bonded to another wafer that has patterned cavities of various shapes and sizes. The bonded pair was then heated until hydrogen-induced silicon layer cleavage occurred along the implanted hydrogen peak concentration, resulting in the transfer of the silicon layer from one wafer to the other. Using this technique, we have been able to form sealed cavities and channels of various shapes and sizes up to 50-/spl mu/m wide, with a 1.6-/spl mu/m-thick silicon membrane. As a process variation, we have also fabricated silicon dioxide membranes for optically transparent applications.
  • Keywords
    elemental semiconductors; ion implantation; membranes; microsensors; silicon; silicon compounds; silicon-on-insulator; surface topography; wafer bonding; 1.6 micron; Si-SiO/sub 2/; ion-cut layer transfer; layer cleavage; optically transparent applications; oxide membranes; patterned cavities; sealed cavities; sub-micron-thick membrane fabrication; surface micro-roughness; thickness uniformity; Biomembranes; Etching; Fabrication; Heat transfer; Hydrogen; Plasma temperature; Shape; Silicon compounds; Silicon on insulator technology; Wafer bonding;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/84.896768
  • Filename
    896768