• DocumentCode
    1428659
  • Title

    Modes of Generation of Runaway Electron Beams in He,  \\hbox {H}_{2} , Ne, and \\hbox {N}_{2}

  • Author

    Tarasenko, Victor F. ; Baksht, Evgenii Kh ; Burachenko, Alexander G. ; Lomaev, Mikhail I. ; Sorokin, Dmitri A.

  • Author_Institution
    Lab. of Opt. Radiat., Siberian Branch of the Russian Acad. of Sci. (SB RAS), Tomsk, Russia
  • Volume
    38
  • Issue
    10
  • fYear
    2010
  • Firstpage
    2583
  • Lastpage
    2587
  • Abstract
    In this paper, the characteristics of runaway electron beams downstream of a foil anode were studied at a pressure of helium, hydrogen, neon, and nitrogen of 1-760 torr. High-voltage pulses (~150 and ~250 kV) with pulse rise times of ~300 and ~500 ps were applied to the tubular cathode-plane anode gap. It is shown that the highest amplitudes of a supershort avalanche electron beam (SAEB) of 100-ps pulse duration are attained in helium, hydrogen, and nitrogen at pressures of ~60, ~30, and ~10 torr, respectively. It is demonstrated that further decreasing the pressure changes the mode of generation of runaway electron beam and increases the beam current amplitude and the voltage pulse duration across the gap. It is found that increasing the pressure of helium, hydrogen, and nitrogen to hundreds of torr decreases the delay time between the instants the voltage pulse is applied to the gap and the SAEB is generated, as well as the maximum voltage across the gap.
  • Keywords
    anodes; avalanche breakdown; cathodes; electron beams; foils; helium; hydrogen; neon; nitrogen; plasma diodes; H2; He; N2; Ne; delay time; foil anode; gas diodes; pressure 1 torr to 760 torr; runaway electron beams; supershort avalanche electron beam; tubular cathode-plane anode gap; Anodes; Diodes; Electron beams; Gases; Helium; Hydrogen; Laboratories; Nitrogen; Pulse generation; Voltage; Gas diode; modes of generation of runaway electron beams;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2010.2041474
  • Filename
    5422636