DocumentCode
1430568
Title
Low-jitter process-independent DLL and PLL based on self-biased techniques
Author
Maneatis, John G.
Author_Institution
Silicon Graphics Comput. Syst., Mountain View, CA, USA
Volume
31
Issue
11
fYear
1996
fDate
11/1/1996 12:00:00 AM
Firstpage
1723
Lastpage
1732
Abstract
Delay-locked loop (DLL) and phase-locked loop (PLL) designs based upon self-biased techniques are presented. The DLL and PLL designs achieve process technology independence, fixed damping factor, fixed bandwidth to operating frequency ratio, broad frequency range, input phase offset cancellation, and, most importantly, low input tracking jitter. Both the damping factor and the bandwidth to operating frequency ratio are determined completely by a ratio of capacitances. Self-biasing avoids the necessity for external biasing, which can require special bandgap bias circuits, by generating all of the internal bias voltages and currents from each other so that the bias levels are completely determined by the operating conditions. Fabricated in a 0.5-μm N-well CMOS gate array process, the PLL achieves an operating frequency range of 0.0025 MHz to 550 MHz and input tracking jitter of 384 ps at 250 MHz with 500 mV of low frequency square wave supply noise
Keywords
CMOS digital integrated circuits; delay circuits; digital phase locked loops; jitter; timing; 0.0025 to 550 MHz; 0.5 micron; DLL design; N-well CMOS gate array process; PLL design; bandwidth to operating frequency ratio; broad frequency range; damping factor; delay-locked loop; input phase offset cancellation; input tracking jitter; low-jitter type; phase-locked loop; process technology independence; self-biased techniques; Bandwidth; Capacitance; Circuits; Damping; Delay; Frequency; Jitter; Phase locked loops; Photonic band gap; Process design;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1996.542317
Filename
542317
Link To Document