• DocumentCode
    1430568
  • Title

    Low-jitter process-independent DLL and PLL based on self-biased techniques

  • Author

    Maneatis, John G.

  • Author_Institution
    Silicon Graphics Comput. Syst., Mountain View, CA, USA
  • Volume
    31
  • Issue
    11
  • fYear
    1996
  • fDate
    11/1/1996 12:00:00 AM
  • Firstpage
    1723
  • Lastpage
    1732
  • Abstract
    Delay-locked loop (DLL) and phase-locked loop (PLL) designs based upon self-biased techniques are presented. The DLL and PLL designs achieve process technology independence, fixed damping factor, fixed bandwidth to operating frequency ratio, broad frequency range, input phase offset cancellation, and, most importantly, low input tracking jitter. Both the damping factor and the bandwidth to operating frequency ratio are determined completely by a ratio of capacitances. Self-biasing avoids the necessity for external biasing, which can require special bandgap bias circuits, by generating all of the internal bias voltages and currents from each other so that the bias levels are completely determined by the operating conditions. Fabricated in a 0.5-μm N-well CMOS gate array process, the PLL achieves an operating frequency range of 0.0025 MHz to 550 MHz and input tracking jitter of 384 ps at 250 MHz with 500 mV of low frequency square wave supply noise
  • Keywords
    CMOS digital integrated circuits; delay circuits; digital phase locked loops; jitter; timing; 0.0025 to 550 MHz; 0.5 micron; DLL design; N-well CMOS gate array process; PLL design; bandwidth to operating frequency ratio; broad frequency range; damping factor; delay-locked loop; input phase offset cancellation; input tracking jitter; low-jitter type; phase-locked loop; process technology independence; self-biased techniques; Bandwidth; Capacitance; Circuits; Damping; Delay; Frequency; Jitter; Phase locked loops; Photonic band gap; Process design;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1996.542317
  • Filename
    542317