• DocumentCode
    1430770
  • Title

    Degradation mechanisms of mechanical connectors on aluminium conductors

  • Author

    Naybour, R.D. ; Farrell, T.

  • Author_Institution
    Electricity Council, Research Centre, Chester, UK
  • Volume
    120
  • Issue
    2
  • fYear
    1973
  • fDate
    2/1/1973 12:00:00 AM
  • Firstpage
    273
  • Lastpage
    280
  • Abstract
    The factors which affect the performance of mechanical connectors for use on aluminium power cables have been investigated. The initial resistance depends upon surface roughness, mechanical load and degree of plastic deformation. The stability of resistance has been studied under conditions of mechanical-load cycling, stress relaxation, interface oxidation, temperature cycling and current loading. The conditions for designing stable mechanical connectors for use on aluminium conductors are given, and the stability of connectors satisfying these conditions has been illustrated by current-cycling measurements.
  • Keywords
    conductors (electric); electric connectors; power cables; Al conductors; current loading; degradation mechanisms; interface oxidation; mechanical connectors; mechanical load cycling; resistance stability; stress relaxation; temperature cycling;
  • fLanguage
    English
  • Journal_Title
    Electrical Engineers, Proceedings of the Institution of
  • Publisher
    iet
  • ISSN
    0020-3270
  • Type

    jour

  • DOI
    10.1049/piee.1973.0060
  • Filename
    5251170