• DocumentCode
    1431168
  • Title

    Multiferroic and fatigue behavior of BiFe0.95Mn0.05O3/Bi0.90La0.10Fe0.85Zn0.15O3 bilayered thin films

  • Author

    Wu, Jiagang ; Wang, John ; Xiao, Dingquan ; Zhu, Jianguo

  • Author_Institution
    Dept. of Mater. Sci., Sichuan Univ., Chengdu, China
  • Volume
    59
  • Issue
    1
  • fYear
    2012
  • fDate
    1/1/2012 12:00:00 AM
  • Firstpage
    14
  • Lastpage
    20
  • Abstract
    Bilayered thin films consisting of BiFe0.95Mn0.05O3 (BFMO) and Bi0.90La0.10Fe0.85Zn0.15O3 (BLFZO) layers were prepared on Pt-coated silicon substrates without any buffer layers by RF sputtering. The (110) orientation was induced with a high phase purity for all bilayers as a result of the introduction of the bottom (110)-oriented BLFZO layer. The low leakage current density of BFMO/BLFZO bilayers could be attributed to a combined effect of the BFMO and BLFZO layers. The dielectric constant increases, the remanent polarization decreases, and the coercive field slightly increases with increasing thickness of the BLFZO layer in BFMO/BLFZO bilayers. Magnetic properties in BFMO/BLFZO bilayers are improved by increasing the BFMO layer thicknesses. A large polarization value of 2Pr ~ 189.5 μC/cm2 is obtained for the BFMO/BLFZO bilayer with a thickness ratio of 3:1, which is much larger than those reported for BFO-based single layers or multilayers, and a good fatigue behavior is demonstrated with an increase in measurement frequencies and driving electric fields.
  • Keywords
    bismuth compounds; buffer layers; coercive force; current density; dielectric polarisation; fatigue; ferroelectric coercive field; ferroelectric thin films; lanthanum compounds; leakage currents; magnetic multilayers; magnetic thin films; multiferroics; permittivity; remanence; sputter deposition; BiFe0.95Mn0.05O3-Bi0.90La0.10Fe0.85Zn0.15O3; Pt-Si; Pt-coated silicon substrate; RF sputtering; bilayered thin films; buffer layers; coercive field; dielectric constant; fatigue behavior; leakage current density; magnetic properties; multiferroics; multilayers; phase purity; remanent polarization; Electric fields; Electric variables measurement; Fatigue; Frequency measurement; Leakage current; Magnetic properties; Substrates;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2012.2151
  • Filename
    6138722