The influence of a top cover on the leakage from microstrip line

Author

Mesa, F. ; Oliner, A.A. ; Jackson, D.R. ; Freire, Manuel J.

Author_Institution

Dept. de Electron. y Electromagn., Seville Univ., Spain

Volume

48

Issue

12

fYear

2000

fDate

12/1/2000 12:00:00 AM

Firstpage

2240

Lastpage

2248

Abstract

When a microwave integrated circuit is enclosed in a package, the top cover causes the transmission lines used in the circuit to become leaky at a lower frequency than otherwise. This effect is investigated in detail for microstrip line, and is found to be particularly dramatic. The leakage is strong enough to produce spurious effects that can ruin the performance of the circuit. The amplitude behavior is obtained by numerically solving for the current on a covered microstrip line due to a delta-gap source excitation. The results clearly show that a strong leaky mode (LM) is excited and that spurious effects due to the LM and from direct radiation from the source generally become more severe at higher frequencies and when the top cover is brought nearer to the strip

Keywords

dispersion (wave); integrated circuit packaging; microstrip lines; microwave integrated circuits; surface electromagnetic waves; waveguide theory; IC package; amplitude behavior; delta-gap source excitation; microstrip line leakage; microwave integrated circuit; spurious effects; strong leaky mode; top cover; transmission lines; Distributed parameter circuits; Frequency; Geometry; Integrated circuit packaging; Microstrip components; Microwave integrated circuits; Power transmission lines; Printed circuits; Strips; Surface waves;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.898970

Filename

898970