• DocumentCode
    1431424
  • Title

    Characterizing transient measurements by use of the step response and the convolution integral

  • Author

    McKnight, Ronald H. ; Lagnese, John E. ; Zhang, Yi Xin

  • Author_Institution
    US DOE, Washington, DC, USA
  • Volume
    39
  • Issue
    2
  • fYear
    1990
  • fDate
    4/1/1990 12:00:00 AM
  • Firstpage
    346
  • Lastpage
    352
  • Abstract
    A method of determining the suitability of a divider system for making measurements of high-voltage transients is described. This method involves the convolution of the experimentally determined step response of the divider with various analytic waveforms which represent ideal waveforms expected in the experimental arrangement. The result of the convolution is compared, both graphically and in terms of relevant parameters such as peak amplitude and front time, with the original waveform. This procedure allows the distortion introduced by the convolution calculation to be seen clearly. The numerical implementation of the method is easily run on a personal computer
  • Keywords
    high-voltage techniques; step response; transients; voltage dividers; voltage measurement; waveform analysis; analytic waveforms; convolution integral; distortion; divider system; front time; high-voltage transients; ideal waveforms; peak amplitude; personal computer; step response; transient measurements; Bandwidth; Convolution; Distortion measurement; Frequency domain analysis; Helium; Integral equations; Microcomputers; Particle measurements; Transfer functions; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.52513
  • Filename
    52513