• DocumentCode
    1432113
  • Title

    Characterization of SIS Receivers Using a Digital Spectrometer

  • Author

    Tong, Cheuk-Yu E. ; Paine, Scott N. ; Blundell, Raymond

  • Author_Institution
    Harvard-Smithsonian Center for Astrophys., Cambridge, MA, USA
  • Volume
    21
  • Issue
    3
  • fYear
    2011
  • fDate
    6/1/2011 12:00:00 AM
  • Firstpage
    659
  • Lastpage
    662
  • Abstract
    Fourier transform based digital spectrometers, which offer wide instantaneous bandwidth and high spectral resolution, are widely used in SIS receiver systems. In this paper, we demonstrate that a digital spectrometer connected to the output of an SIS receiver can be used to probe the standing wave structure in the optics between the SIS mixer and a terminating input load. It can be shown that this standing wave induces ripples in the output power spectrum of the mixer, the amplitude of which depends on the product of the voltage reflection coefficients of the load and the mixer. This relation can be exploited to derive the input reflection coefficient of the SIS mixer as well as its sideband ratio. Both the theory and experimental details will be presented.
  • Keywords
    Fourier transform spectrometers; Fourier transforms; standing wave meters; superconducting photodetectors; superconductor-insulator-superconductor mixers; Fourier transform; SIS receiver; digital spectrometer; high spectral resolution; power spectrum; voltage reflection coefficient; wide instantaneous bandwidth; Amplitude modulation; Calibration; Impedance matching; Mixers; Noise; Optical waveguides; Receivers; Spectrometer; standing wave measurements; superconductor-insulator-superconductor (SIS) mixers;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2010.2100016
  • Filename
    5696780