Reflectivity of coated and tilted semiconductor facets

Author

Buus, Jens ; Farries, Mark C. ; Robbins, David J.

Author_Institution

GEC Marconi Mater. Technol. Ltd., Towcester, UK

Volume

27

Issue

6

fYear

1991

fDate

6/1/1991 12:00:00 AM

Firstpage

1837

Lastpage

1842

Abstract

A comparatively simple model for calculating the reflectivity of coated and tilted semiconductor facets is described. The model can be briefly described as follows: the forward-propagating waveguide field is propagated to the (tilted) facet, and a Fourier transformation is performed. Each angular component is then further decomposed into parallel and perpendicular components. Fresnel reflection coefficients are applied, and the coupling integral of the reflected field (in k -space) and the Fourier transform of the backward-propagating waveguide field are evaluated. The model takes the two-dimensional waveguide structure into account, includes polarization effects, and can be applied to multilayer coatings

Keywords

Fourier transform optics; optical films; optical waveguide theory; reflectivity; semiconductors; Fourier transformation; Fresnel reflection coefficients; angular component; backward-propagating waveguide field; coupling integral; forward-propagating waveguide field; model; multilayer coatings; perpendicular components; polarization effects; reflectivity; tilted semiconductor facets; two-dimensional waveguide structure; Coatings; Nonhomogeneous media; Polarization; Reflectivity; Refractive index; Semiconductor optical amplifiers; Semiconductor waveguides; Surface waves; Tellurium; Waveguide components;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/3.90013

Filename

90013