Toward a BITE for Real-Time Life Estimation of Capacitors Subjected to Thermal Stress

Author

Albertini, Andrea ; Masi, Maria Gabriella ; Mazzanti, Giovanni ; Peretto, Lorenzo ; Tinarelli, Roberto

Author_Institution

Dept. of Electr. Eng., Alma Mater Studiorum, Bologna, Italy

Volume

60

Issue

5

fYear

2011

fDate

5/1/2011 12:00:00 AM

Firstpage

1674

Lastpage

1681

Abstract

The use of a built-in test equipment (BITE) that is able to provide a real-time diagnostic of a monitored device allows increasing reliability and decreasing costs. The BITE operation can be based on a suitable life model of the device that must relate the time to failure to the “stress history” of the component. The life model is developed by exploiting the results of a proper measurement campaign. This paper investigates a life model for capacitors subjected to both constant and time-varying temperatures by illustrating the test system and discussing the achieved results.

Keywords

built-in self test; capacitors; reliability; thermal stresses; BITE operation; built in test equipment; real time life estimation; reliability; thermal stress; time varying temperature; Aging; Capacitance; Capacitors; Stress; Temperature; Temperature measurement; Thermal stresses; Arrhenius model; capacitors; constant thermal stress; time-varying thermal stress;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2010.2102392

Filename

5699923