• DocumentCode
    1435061
  • Title

    Tomographic Imaging and Monitoring of Buildings With Very High Resolution SAR Data

  • Author

    Reale, D. ; Fornaro, G. ; Pauciullo, A. ; Zhu, X. ; Bamler, R.

  • Author_Institution
    Inst. for the Electromagn. Sensing of the Environ. (IREA), Nat. Res. Council (CNR), Naples, Italy
  • Volume
    8
  • Issue
    4
  • fYear
    2011
  • fDate
    7/1/2011 12:00:00 AM
  • Firstpage
    661
  • Lastpage
    665
  • Abstract
    Layover is frequent in imaging and monitoring with synthetic aperture radar (SAR) areas characterized by a high density of scatterers with steep topography, e.g., in urban environment. Using medium-resolution SAR data tomographic techniques has been proven to be capable of separating multiple scatterers interfering (in layover) in the same pixel. With the advent of the new generation of high-resolution sensors, the layover effect on buildings becomes more evident. In this letter, we exploit the potential of the 4-D imaging applied to a set of TerraSAR-X spotlight acquisitions. Results show that the combination of high-resolution data and advanced coherent processing techniques can lead to impressive reconstruction and monitoring capabilities of the whole 3-D structure of buildings.
  • Keywords
    geophysical image processing; image reconstruction; image resolution; radar resolution; remote sensing by radar; synthetic aperture radar; 3-D structure; 4-D imaging; TerraSAR-X spotlight acquisitions; buildings; high-resolution sensors; impressive reconstruction; medium-resolution SAR data tomographic techniques; scatterer density; steep topography; synthetic aperture radar; tomographic imaging; urban environment; Buildings; Monitoring; Pixel; Remote sensing; Synthetic aperture radar; Tomography; 4-D SAR imaging; Differential interferometric synthetic aperture radar (DInSAR); SAR tomography; TerraSAR-X (TSX); multidimensional SAR processing; synthetic aperture radar (SAR);
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2010.2098845
  • Filename
    5701652