A 10 V Josephson Voltage Standard Comparison Between NIST and INMETRO as a Link to BIPM

Author

Landim, Regis Pinheiro ; Tang, Yi-hua ; Afonso, Edson ; Ferreira, Vitor

Author_Institution

Inst. Nac. de Metrol., Normalizacao e Qualidade Ind. (INMETRO), Rio de Janeiro, Brazil

Volume

60

Issue

7

fYear

2011

fDate

7/1/2011 12:00:00 AM

Firstpage

2353

Lastpage

2358

Abstract

This paper describes a 10 V Josephson Voltage Standard (JVS) direct comparison between the National Institute of Standards and Technology (NIST) and the Instituto Nacional de Metrologia, Normalização e Qualidade Industrial (INMETRO) using automatic data acquisition. The results were in agreement to within 1.1 nV and the mean difference between the two JVSs at 10 V is 0.54 nV with a pooled combined standard uncertainty of 1.48 nV. Considering a recent JVS comparison between NIST and the Bureau International des Poids et Mesures (BIPM), the difference between INMETRO and the BIPM thus was found to be -0.26 nV with a standard uncertainty of 1.76 nV. INMETRO JVS improvements since the 2006 INMETRO-BIPM comparison are also described.

Keywords

Josephson effect; measurement uncertainty; voltage measurement; Josephson voltage standard; automatic data acquisition; standard uncertainty; voltage 0.54 nV; voltage 1.1 nV; voltage 1.48 nV; voltage 1.76 nV; voltage 10 V; Arrays; Measurement uncertainty; NIST; Oscillators; Radiation detectors; Uncertainty; Voltage measurement; Automation; Josephson Voltage Standard (JVS); Josephson arrays; interlaboratory comparison; uncertainty;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2010.2099370

Filename

5703127