• DocumentCode
    1437282
  • Title

    Spike voltages seen during "quick charge" ramp limitation tests on Nb/sub 3/Sn cable-in-conduit conductors

  • Author

    Takayasu, M. ; Vysotsky, V.S. ; Jeong, S. ; Michael, P.C. ; Schultz, J.H. ; Minervini, J.V.

  • Author_Institution
    Plasma Fusion Center, MIT, Cambridge, MA, USA
  • Volume
    7
  • Issue
    2
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    150
  • Lastpage
    154
  • Abstract
    Spike voltages observed during ramp rate limitation tests on sub-sized Nb/sub 3/Sn cable-in-conduit superconductors are analyzed using current loop model. The effects of loop currents on the ramp limitations of multi strand superconducting cables are discussed. Current loops existing in multi strand cables generate excess local currents that quench strands and produce voltage spikes. Experimental results previously reported as abnormal ramp rate limitations are explained by loop current phenomena.
  • Keywords
    multifilamentary superconductors; niobium alloys; superconducting cables; tin alloys; Nb/sub 3/Sn; cable-in-conduit conductor; current loop model; multistrand superconducting cable; quenching; quick charge ramp rate limitation test; spike voltage; Conductors; Contact resistance; Current distribution; Niobium; Power cables; Superconducting cables; Superconductivity; Testing; Tin; Voltage;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.614444
  • Filename
    614444
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1437282