• DocumentCode
    1438322
  • Title

    An asynchronous instruction length decoder

  • Author

    Stevens, Kenneth S. ; Rotem, Shai ; Ginosar, Ran ; Beerel, Peter ; Myers, Chris J. ; Yun, Kenneth Y. ; Koi, R. ; Dike, Charles ; Roncken, Marly

  • Author_Institution
    Intel Corp., Hillsboro, OR, USA
  • Volume
    36
  • Issue
    2
  • fYear
    2001
  • fDate
    2/1/2001 12:00:00 AM
  • Firstpage
    217
  • Lastpage
    228
  • Abstract
    This paper describes an investigation of potential advantages and pitfalls of applying an asynchronous design methodology to an advanced microprocessor architecture. A prototype complex instruction set length decoding and steering unit was implemented using self-timed circuits. [The Revolving Asynchronous Pentium(R) Processor Instruction Decoder (RAPPID) design implemented the complete Pentium II(R) 32-bit MMX instruction set.] The prototype chip was fabricated on a 0.25 μm CMOS process and tested successfully. Results show significant advantages - in particular, performance of 2.5-4.5 instructions per nanosecond - with manageable risks using this design technology. The prototype achieves three times the throughput and half the latency, dissipating only half the power and requiring about the same area as the fastest commercial 400 MHz clocked circuit fabricated on the same process
  • Keywords
    CMOS logic circuits; asynchronous circuits; decoding; design for testability; high-speed integrated circuits; instruction sets; integrated circuit design; logic design; microprocessor chips; timing; 0.25 micron; 32 bit; 700 MHz to 3.6 GHz; CMOS process; DFT; Pentium II MMX instruction set; advanced microprocessor architecture; asynchronous design methodology; asynchronous instruction length decoder; complex instruction set length decoding; instruction set length decoding/steering unit; microarchitecture; revolving asynchronous Pentium processor instruction decoder; self-timed circuits; Automatic testing; CMOS process; CMOS technology; Circuit testing; Decoding; Design methodology; Microprocessors; Prototypes; Risk management; Technology management;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.902762
  • Filename
    902762