• DocumentCode
    1438826
  • Title

    Tensile and bending piezoelectricity of single-film PVDF monomorphs and bimorphs

  • Author

    Sessler, G.M. ; Berraissoul, A.

  • Author_Institution
    Inst. for Electroacoust., Tech. Univ. of Darmstadt, West Germany
  • Volume
    24
  • Issue
    2
  • fYear
    1989
  • fDate
    4/1/1989 12:00:00 AM
  • Firstpage
    249
  • Lastpage
    254
  • Abstract
    Films of 22 μm thick polyvinylidenefluoride (PVDF) are poled with partially penetrating monoenergetic electron beams, resulting in monomorph polarizations (zero polarization over part of the sample thickness and large polarization over the remaining part) or bimorph polarizations (polarization changing its sign within the sample) with corresponding distributions of piezoelectricity. Experimental data for the tensile piezoelectric strain constant d31 and the bending piezoelectric stress constant β31 with values as high as 13 pC/N and 110 nC/m, respectively, are reported. Both constants decrease with increasing energy of the electron beam. Upon annealing, d31 drops initially more rapidly than β31, whereas the opposite is true at later times. The mechanical resonance frequencies and the mechanical deflection under DC bias are discussed
  • Keywords
    electron beam effects; piezoelectric thin films; polymer films; 22 micron; PVDF; annealing; bending piezoelectric stress constant; bending piezoelectricity; bimorph polarizations; electron beam poling; mechanical deflection under DC bias; mechanical resonance frequencies; monomorph polarizations; penetrating monoenergetic electron beams; polymer films; polyvinylidenefluoride; tensile piezoelectric strain constant; tensile piezoelectricity; Annealing; Electron beams; Piezoelectric films; Piezoelectric polarization; Piezoelectricity; Poles and zeros; Resonance; Resonant frequency; Tensile strain; Tensile stress;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/14.90283
  • Filename
    90283