Modeling Oscillator Injection Locking Using the Phase Domain Response

Author

Dunwell, Dustin ; Carusone, Anthony Chan

Author_Institution

Edward S. Rogers Sr. Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada

Volume

60

Issue

11

fYear

2013

fDate

Nov. 2013

Firstpage

2823

Lastpage

2833

Abstract

This paper presents a simulation-based model for the behavior of injection-locked oscillators (ILOs) that can be applied to any oscillator topology under any strength of injected signal. By using the phase domain response (PDR) of an oscillator, the proposed model is shown to accurately predict the behavior of ILOs with asymmetric lock ranges or those using injection into multiple locations. It can also model subharmonic injection locking behavior. The model is validated through comparison with SPICE simulations as well as measured results of a multiplying ILO fabricated in 65-nm CMOS.

Keywords

CMOS integrated circuits; SPICE; injection locked oscillators; integrated circuit modelling; SPICE simulations; asymmetric lock ranges; injected signal; oscillator injection locking; oscillator topology; phase domain response; size 65 nm; subharmonic injection locking behavior; Frequency multiplication; impulse sensitivity function (ISF); injection locking; jitter tracking; locking range; locking time; phase-domain modeling;

fLanguage

English

Journal_Title

Circuits and Systems I: Regular Papers, IEEE Transactions on

Publisher

ieee

ISSN

1549-8328

Type

jour

DOI

10.1109/TCSI.2013.2252654

Filename

6496169