• DocumentCode
    1441866
  • Title

    A two-dimensional beam profile monitor based on residual gas ionization

  • Author

    Shapira, D. ; Lewis, T.A.

  • Author_Institution
    Div. of Phys., Oak Ridge Nat. Lab., TN, USA
  • Volume
    47
  • Issue
    6
  • fYear
    2000
  • fDate
    12/1/2000 12:00:00 AM
  • Firstpage
    1969
  • Lastpage
    1973
  • Abstract
    A two-dimensional beam profile monitor based on tracking the ionization of the residual gas molecules in the evacuated beam pipe is described. Tracking in position and time of the ions and electrons produced in the ionization enables simultaneous position sampling in three dimensions. Special features which make it possible to sample very low beam currents were employed
  • Keywords
    ionisation; particle beam diagnostics; evacuated beam pipe; residual gas ionization; residual gas molecules; simultaneous position sampling; two-dimensional beam profile monitor; very low beam currents; Detectors; Electrodes; Electron beams; Ion beams; Ionization; Microchannel; Monitoring; Particle beams; Sampling methods; Structural beams;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.903830
  • Filename
    903830