DocumentCode
1442816
Title
A study on failure prediction in a plasma reactor
Author
Rietman, Edward A. ; Beachy, Milton
Author_Institution
Lucent Technol., AT&T Bell Labs., Murray Hill, NJ, USA
Volume
11
Issue
4
fYear
1998
fDate
11/1/1998 12:00:00 AM
Firstpage
670
Lastpage
680
Abstract
We use several approaches to demonstrate that neural networks can detect precursors to failure. That is, they can detect subtle changes in the process signals. In some cases these subtle changes are early warnings that a subsystem failure is imminent. The results on detection of precursors and faults with various types of time-delay neural networks are discussed. We also measure the noise inherent in our database and place bounds on neural network prediction in the presence of noise. We observe that the noise level can be as high as 40% for detection of failures and can be at 30% to still detect precursors to failure. We note that although self-organizing networks for classification of faults seems like a good idea, in fact they do not perform well in the presence of noise. Lastly, we show that neural networks can induce, or self-build, Markov models from process data and these models can be used to predict system state to a significant distance in the future (e.g., 100 wafers)
Keywords
Markov processes; failure analysis; integrated circuit yield; neural nets; production engineering computing; sputter etching; time series; Markov models; failure prediction; noise level; plasma etching; plasma reactor; process signals; semiconductor processing equipment; subsystem failure; system state; time-delay neural networks; Databases; Fault detection; Inductors; Neural networks; Noise level; Noise measurement; Plasmas; Predictive models; Semiconductor device modeling; Signal processing;
fLanguage
English
Journal_Title
Semiconductor Manufacturing, IEEE Transactions on
Publisher
ieee
ISSN
0894-6507
Type
jour
DOI
10.1109/66.728564
Filename
728564
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