• DocumentCode
    1443985
  • Title

    Built-in self-test structures around cellular automata and counters

  • Author

    Das, A.K. ; Pandey, M. ; Gupta, A. ; Chaudhuri, P.P.

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
  • Volume
    137
  • Issue
    4
  • fYear
    1990
  • fDate
    7/1/1990 12:00:00 AM
  • Firstpage
    269
  • Lastpage
    276
  • Abstract
    BIST structures for on-chip generation of random, exhaustive and deterministic test patterns have been discussed in the paper. Isomorphism between maximal length LFSR (linear feedback shift register) and exhaustive CA has been established and the pseudorandomness properties of CAs in terms of well-suited autocorrelation functions have been investigated. Owing to the regularity in interconnection structure, additive group CA (cellular automata) offers advantages over LFSR. A method of covering deterministic test set by a counter-based scheme and its optimisation based on AT2 complexity has been discussed.
  • Keywords
    automatic testing; finite automata; integrated circuit testing; logic testing; AT2 complexity; autocorrelation functions; built-in self test structures; cellular automata; counters; deterministic test patterns; exhaustive CA; isomorphism; maximal length LFSR; on-chip generation; pseudorandomness properties;
  • fLanguage
    English
  • Journal_Title
    Computers and Digital Techniques, IEE Proceedings E
  • Publisher
    iet
  • ISSN
    0143-7062
  • Type

    jour

  • Filename
    54330
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1443985